An Evolutionary Methodology for Test Generation for Peripheral Cores Via Dynamic FSM Extraction
4th European Workshop on Bio-Inspired Heuristics for Design Automation (EvoHOT2008), March 26-28, 2008, Napoli, Italy, pp. 214-223
KEYWORDS:
Dynamic FSM,
Genetic Algorithm,
Peripheral testing,
SBST,
approaximative methods,
microGP,
ugp3
ABSTRACT
Traditional test generation methodologies for peripheral cores are performed by a skilled test engineer, leading to long generation times. In this paper a test generation methodology based on an evolutionary tool which exploits high level metrics is presented. To strengthen the correlation between high-level coverage and the gate-level fault coverage, in the case of peripheral cores, the FSMs embedded in the system are identified and then dynamically extracted via simulation, while transition coverage is used as a measure of how much the system is exercised. The results obtained by the evolutionary tool outperform those obtained by a skilled engineer on the same benchmark.
[RSSS08] D. Ravotto, E. Sanchez, M. Schillaci, and G. Squillero, "An Evolutionary Methodology for Test Generation for Peripheral Cores Via Dynamic FSM Extraction," 4th European Workshop on Bio-Inspired Heuristics for Design Automation (EvoHOT2008), March 26-28, 2008, Napoli, Italy, pp. 214-223 |
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