Automatic Test Programs Generation Driven by Internal Performance Counters
MTV'04: 5th International Workshop on Microprocessor Test and Verification, pp. 8-13
KEYWORDS:
Approximate Methods,
Evolutionary Algorithms,
Genetic Programming,
Micro-Processors,
MicroGP,
On-Target Verification
ABSTRACT
In the past performance counters have been available to top-end microprocessors as hardware luxuries for pro-filing critical applications. Today, on the contrary, sev-eral desktop microprocessors contain hardware support for monitoring performance events. This paper proposes a new approach to automatic test program generation that exploits such hardware to monitor specific micro- architectural events. In the approach, the generation tool repeatedly evaluates and improves candidate pro-grams directly running on the target microprocessor: candidate programs are not "simulated", but rather "executed". The fast evaluation of candidate tests en-ables the use of an automatic methodology even on large designs. As a case study, an experiment targeting the Intel�� Pentium�� 4 microprocessor is reported.
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[LSSS04] W. Lindsay, E. Sanchez, M. Sonza Reorda, G. Squillero, "Automatic Test Programs Generation Driven by Internal Performance Counters," MTV'04: 5th International Workshop on Microprocessor Test and Verification, pp. 8-13 |
