Automatic Test Program Generation for Pipelined Processors
SAC2003: The Eighteenth Annual ACM Symposium on Applied Computing, Melbourne, Florida (USA), March 9-12, 2003, pp. 736-740
KEYWORDS:
ATPG,
Approximate Methods,
Evolutionary Algorithms,
Genetic Programming,
Micro-Processors,
MicroGP,
RT-Level,
Simulation-Based Approaches,
VHDL
ABSTRACT
The continuous advances in microelectronics design are creating a significant challenge to design validation in general, but tackling pipelined microprocessors is remarkably more demanding. This paper presents a methodology to automatically induce a test program for a microprocessor maximizing a given verification metric. The approach exploits a new evolutionary algorithm, close to Genetic Programming, able to cultivate effective assembly-language programs. The proposed methodology was used to verify the DLX/pII, an open-source processor with a 5-stage pipeline. Code-coverage was adopted in the paper, since it can be considered the required starting point for any simulation-based functional verification processes. Experimental results clearly show the effectiveness of the approach.
| Related files: |
| sac03.pdf | Adobe Acrobat portable document |
| sac03.pdf | Adobe Acrobat portable document [SENSIBLE DATA] |
Notez Bien:
Access to sensible data is granted to domain only. Any use without explicit permission of the CAD group is illegal under the current copyright laws.
Copyright note for papers published by ACM:
Permission to make digital or hard copies of this work for personal or
classroom use is granted without fee provided that copies bear this
notice and the full citation on the first page. Copyrights for
components of this work owned by others than ACM must be
honored. Abstracting with credit is permitted. To copy otherwise, to
republish, to post on servers or to distribute to lists, requires
prior specific permission and/or a fee.
[CSSq03] F. Corno, M. Sonza Reorda, G. Squillero, "Automatic Test Program Generation for Pipelined Processors," SAC2003: The Eighteenth Annual ACM Symposium on Applied Computing, Melbourne, Florida (USA), March 9-12, 2003, pp. 736-740 |