A P1500 compliant BIST-based approach to embedded RAM Diagnosis
ATS, IEEE Asian Test Symposium, 2001
ABSTRACT
This paper deals with the diagnosis of faulty embedded RAMs and outlines the solution which is currently under evaluation within STMicroelectronics. The proposed solution exploits a BIST module implementing a March algorithm, defines a wrapper allowing its interface with a TAP controller, and describes a diagnostic procedure running in the external ATE software environment. The approach allows to test multiple modules in the same chip through a single TAP interface and is compliant with the proposed P1500 standard for Embedded Core Test. Some preliminary experimental results gathered using a sample circuit are reported, showing the effectiveness of the proposed solution in terms of area and time requirements.
| Related files: | |
|---|---|
| ats01c.pdf | Adobe Acrobat portable document |
Copyright note for papers published by the IEEE Computer Society:
Copyright IEEE. Personal use of this material is permitted. However,
permission to reprint/republish this material for advertising or
promotional purposes or for creating new collective works for resale
or redistribution to servers or lists, or to reuse any copyrighted
component of this work in other works, must be obtained from the IEEE.
[ACGR01] D. Appello, F. Corno, M. Giovinetto, M. Rebaudengo, M. Sonza Reorda, "A P1500 compliant BIST-based approach to embedded RAM Diagnosis," ATS, IEEE Asian Test Symposium, 2001