An Experimental Analysis of the Effectiveness of the Circular Self-Test Path Technique
EURO-DAC94: IEEE European Design Automation Conference, Grenoble (F), September 1994
ABSTRACT
The paper analyzes the effectiveness of the Circular Self-Test Path technique from an experimental point of view. Several fault simulation experiments have been performed on the ISCAS89 benchmark set as well as on a set of real circuits: in contrast to the theoretical analysis proposed in [PKKa92], a very high Fault Coverage has been attained with a limited number of clock cycles, provided that the circuit does not enter a loop. This danger can not be avoided even if clever strategies for Flip-Flops ordering, aimed at reducing the functional adjacency, are adopted; the effects of carefully choosing the initial state are investigated and an approach based on Formal Verification techniques is proposed.
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[CPSe94] F. Corno, P. Prinetto, M. Sonza Reorda, "An Experimental Analysis of the Effectiveness of the Circular Self-Test Path Technique," EURO-DAC94: IEEE European Design Automation Conference, Grenoble (F), September 1994