High-Level Observability for Effective High-Level ATPG
VTS2000: 18th IEEE VLSI Test Symposium, Montreal, Canada, May 2000, pp. 411-416
KEYWORDS: ATPG,
Approximate Methods,
Evolutionary Algorithms,
Genetic Algorithms,
Rt-Level,
Simulation-Based Approaches,
VHDL
ABSTRACT
This paper focuses on observability, one of the open issues in High-Level test generation. Three different approximate metrics for taking observability into account during RT-level ATPG are presented. Metrics range from a really na? ve and optimistic one to more sophisticated analysis. Metrics are evaluated including them into the calculation of the fitness function used in a RT-level ATPG. Advantages and disadvantages are illustrated. Experimental results show how sharp observability metrics are crucial for making effective RT-level ATPG possible: test sequences generated at RT-level outperform commercial gate-level ATPGs on some ITC99 benchmark circuits.
| Related files: | |
|---|---|
| vts2000a.pdf | Adobe Acrobat portable document |
Copyright note for papers published by the IEEE Computer Society:
Copyright IEEE. Personal use of this material is permitted. However,
permission to reprint/republish this material for advertising or
promotional purposes or for creating new collective works for resale
or redistribution to servers or lists, or to reuse any copyrighted
component of this work in other works, must be obtained from the IEEE.
[CSSq00] F. Corno, M. Sonza Reorda, G. Squillero, "High-Level Observability for Effective High-Level ATPG," VTS2000: 18th IEEE VLSI Test Symposium, Montreal, Canada, May 2000, pp. 411-416