An Industrial Environment for High-Level Fault-Tolerant Structures Insertion and Validation
VTS2002: 20th IEEE VLSI Test Symposium, Monterey, CA (USA), 28 April - 2 May, 2002, pp. 229-236
ABSTRACT
When designing a VLSI circuits, most of the efforts are now performed at levels of abstractions higher than gate. Correspondingly to this clear trend, there is a growing request to tackle safety-critical issues directly at the RT-level. This paper presents a complete environment for considering safety issues at the RT level. The environment was implemented and tested by an industry for devising a sample safety-critical device. Designers were permitted to assess the effects of transient faults, automatically add fault-tolerant structures, and validate the results working on the same circuit descriptions and acting in a coherent framework. The evaluation showed the effectiveness of the proposed environment.
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[BCEG02] L. Berrojo, F. Corno, L. Entrena, I. Gonz lez, C. Lopez, M. Sonza Reorda, G. Squillero, "An Industrial Environment for High-Level Fault-Tolerant Structures Insertion and Validation," VTS2002: 20th IEEE VLSI Test Symposium, Monterey, CA (USA), 28 April - 2 May, 2002, pp. 229-236