Publications

  1. A P1500-compatible programmable BIST approach for the test of embedded flash memories
    P. Bernardi, M. Rebaudengo, M. Sonza Reorda, M. Violante
    DOI: 10.1109/DATE.2003.1253692
    ABSTRACT: In this paper we present a microprocessor-based approach suitable for embedded flash memory testing in a System-on-a-chip (SoC) environment. The main novelty of the approach is the high flexibility, which guarantees easy exploitation of the same architecture to different memory cores. The proposed approach is compatible with the P1500 standard. A case study has been developed and demonstrates the advantages of the proposed core test strategy in terms of area overhead and test application time

  2. A new Software-based technique for low-cost Fault-Tolerant application
    M. Rebaudengo, M. Sonza Reorda, M. Violante

  3. A programmable BIST approach for the diagnosis of embedded memory cores
    D. Appello, P. Bernardi, A. Fudoli, M. Rebaudengo, M. Sonza Reorda, V. Tancorre, M. Violante

  4. A real-time evolutionary algorithm for Web prediction
    D. Bonino, F. Corno, G. Squillero
    Proceedings of the IEEE/WIC International Conference on Web Intelligence

  5. Accurate Dependability Analysis of CAN-based Networked Systems
    J. Perez, M. Sonza Reorda, M. Violante

  6. Accurate and Efficient Analysis of Single Event Transients in VLSI Circuits
    M. Violante, M. Sonza Reorda

  7. Accurate and efficient analysis of single event transients in VLSI circuits
    V. Sonza Reoda M
    DOI: 10.1109/OLT.2003.1214374

  8. An Accurate Analysis of the Effects of Soft Errors in the Instruction and Data Caches of a Pipelined Microprocessor
    M. Rebaudengo, M. Sonza Reorda, M. Violante

  9. An Enhanced Framework for Microprocessor Test-Program Generation
    F. Corno, G. Squillero
    Lecture Notes in Computer Science (vol 2610)
    DOI: 10.1007/3-540-36599-0_28
    ABSTRACT: Test programs are fragment of code, but, unlike ordinary application programs, they are not intended to solve a problem, nor to calculate a function. Instead, they are supposed to give information about the machine that actually executes them. Today, the need for effective test programs is increasing, and, due to the inexorable increase in the number of transistor that can be integrated onto a single silicon die, devising effective test programs is getting more problematical. This paper presents µGP, an efficient and versatile approach to testprogram generation based on an evolutionary algorithm. The proposed methodology is highly versatile and improves previous approaches, allowing the testprogram generator generating complex assembly programs that include subroutines calls

  10. An Evolutionary Approach to Web Request Prediction
    D. Bonino, F. Corno, G. Squillero

  11. An RT-level concurrent error detection technique for data dominated systems
    O. Golubeva, M. Sonza Reorda, M. Violante
    DOI: 10.1109/OLT.2003.1214385

  12. An RT-level concurrent error detection technique for data dominated systems
    O. Goubeva, M. Sonza Reorda, M. Violante
    DOI: 10.1109/OLT.2003.1214385

  13. An efficient algorithm for the extraction of compressed diagnostic information from embedded memory cores
    P. Bernardi, M. Rebaudengo, M. Sonza Reorda

  14. Analyzing SEU Effects in SRAM-based FPGAs
    M. Violante, M. Ceschia, M. Sonza Reorda, A. Paccagnella, P. Bernardi, M. Rebaudengo, D. Bortolato, M. Bellato, P. Zambolin, A. Candelori
    DOI: 10.1109/OLT.2003.1214377

  15. Automatic Test Program Generation for Pipelined Processors
    F. Corno, M. Sonza Reorda, G. Squillero
    Proceedings of the 2003 ACM symposium on Applied computing
    DOI: 10.1145/952532.952676

  16. Code generation for functional validation of pipelined microprocessors
    F. Corno, G. Squillero, M. Sonza Reorda
    Proceedings of the 8th IEEE European Test Workshop

  17. Dependability Analysis of CAN Networks: an emulation-based approach
    J. Perez, M. Sonza Reorda, M. Violante

  18. Detailed comparison of dependability analyses performed at RT and gate levels
    A. Ammari, R. Leveugle, M. Sonza Reorda, M. Violante

  19. Dynamic Prediction of Web Requests
    F. Corno, D. Bonino, G. Squillero
    CEC03: 2003 IEEE Congress on Evolutionary Computation

  20. Emulation-based Analysis of Soft Errors in Deep Sub-micron Circuits
    M. Sonza Reorda, M. Violante
    DOI: 10.1007/b12007

  21. Exploiting Auto-Adaptive microGP for Highly Effective Test Programs Generation
    F. Corno, G. Squillero
    Lecture Notes in Computer Science (vol 2606)
    DOI: 10.1007/3-540-36553-2_24

  22. Exploiting co-evolution and a modified island model to climb the Core War hill
    F. Corno, E. Sanchez, G. Squillero
    DOI: 10.1109/CEC.2003.1299947

  23. Exploiting programmable BIST for the diagnosis of embedded memory cores
    D. Appello, P. Bernardi, A. Fudoli, M. Rebaudengo, M. Sonza Reorda, V. Tancorre, M. Violante
    DOI: 10.1109/TEST.2003.1270861

  24. Fully automatic test program generation for microprocessor cores
    F. Corno, G. Cumani, M. Sonza Reorda, G. Squillero
    Proceedings of the conference on Design, Automation and Test in Europe - Volume 1

  25. High-level test generation for hardware testing and software validation
    O. Goloubeva, M. Sonza Reorda, M. Violante
    DOI: 10.1109/HLDVT.2003.1252488

  26. Soft-error Detection Using Control Flow Assertions
    O. Goloubeva, M. Rebaudengo, M. Sonza Reorda, M. Violante

  27. Soft-error detection using control flow assertions
    O. Goloubeva, M. Rebaudengo, M. Sonza Reorda, M. Violante
    DOI: 10.1109/DFTVS.2003.1250158