Publications

  1. A New Placement Algorithm for the Mitigation of Multiple Cell Upsets in SRAM-based FPGAs
    L. Sterpone, N. Battezzati
    IEEE Design, Automation and Test in Europe 2010

  2. A Novel Scalable and Reconfigurable Emulation Platform for Embedded Systems Verification
    M. Di Marzio, M. Grosso, M. Sonza Reorda, L. Sterpone, G. Audisio, M. Sabatini
    Circuits and Systems (ISCAS), Proceedings of 2010 IEEE International Symposium on
    DOI: 10.1109/ISCAS.2010.5537422

  3. A Programmable BIST for DRAM Testing and Diagnosis
    M. Grosso, P. Bernardi, M. Sonza Reorda, Y. Zhang

  4. A Software-based self-test methodology for system peripherals
    M. Grosso, H. Perez, D. Ravotto, E. Sanchez, M. Sonza Reorda, J. Velasco Medina
    KEYWORDS: cache; processori; collaudo

  5. A fault grading methodology for software-based self-test programs in systems-on-chip
    O. Ballan, P. Bernardi, G. Fontana, M. Grosso, E. Sanchez
    DOI: 10.1109/MTV.2010.16

  6. A framework to support the design of COTS-based reliable space computers for on-board data handling
    V. Campagna S.
    DOI: 10.1109/IOLTS.2010.5560229

  7. A hardware accelerated framework for the generation of design validation programs for SMT processors
    E. Sanchez, D. Ravotto, M. Sonza Reorda
    13th IEEE International Symposium on Design & Diagnostics of Elctronic Circuits and Systems

  8. A new framework for the automatic insertion of mitigation structures in circuits netlists
    N. Battezzati, D. Serrone, M. Violante

  9. A tester architecture suitable for MEMS calibration and testing
    L. Ciganda, P. Bernardi, M. Sonza Reorda, D. Barbieri, M. Straiotto, L. Bonaria
    KEYWORDS: mems calibration and testing; tester architecture; parallelism

  10. An Exact and Efficient Critical Path Tracing Algorithm
    A. Bosio, P. Girard, S. Pravossoudovitch, P. Bernardi, M. Sonza Reorda
    DOI: 10.1109/DELTA.2010.35

  11. An On-line Fault Detection Technique based on Embedded Debug Features
    M. Grosso, M. Sonza Reorda, M. Portela-Garcia, M. Garcia-Valderas, C. Lopez-Ongil, L. Entrena
    KEYWORDS: debug; circuiti integrati; collaudo; affidabilità; processori

  12. An adaptive tester architecture for volume diagnosis
    P. Bernardi, M. Grosso, M. Sonza Reorda
    KEYWORDS: circuiti integrati; ate; collaudo

  13. An enhanced strategy for functional stress pattern generation for system-on-chip reliability characterization
    M. De Carvalho, P. Bernardi, E. Sanchez, M. Sonza Reorda
    KEYWORDS: reliability characterization; automatic stress pattern generation; functional stress; system-on-chip

  14. An integrated flow for the design of hardened circuits on SRAM-based FPGAs
    C. Bolchini, A. Miele, C. Sandionigi, N. Battezzati, L. Sterpone, M. Violante
    DOI: 10.1109/ETSYM.2010.5512757

  15. Analysis of Root Causes of Alpha Sensitivity Variations on Microprocessors Manufactured using Different Cell Layouts
    P. Rech, M. Grosso, F. Melchiori, D. Loparco, D. Appello, L. Dilillo, A. Paccagnella, M. Sonza Reorda
    KEYWORDS: fault tolerance circuiti integrati radiazioni

  16. Application-oriented SEU cross-section of a processor soft core for Atmel RHBD FPGAs
    N. Battezzati, F. Margaglia, M. Violante, F. Decuzzi, D. Merodio Codinachs, B. Bancelin

  17. CUMULATIVE EMBEDDED MEMORY FAILURE BITMAP DISPLAY ANALYSIS
    P. Bernardi, A. Panariti, M. Sonza Reorda, T. Kerekes, D. Appello, M. Barone
    13th IEEE International Symposium on Design & Diagnostics of Electronic Circuits and Systems

  18. Cumulative embedded memory failure bitmap display & analysis
    N. Campanelli, T. Kekeres, P. Bernardi, M. De Carvalho, A. Panariti, M. Sonza Reorda, D. Appello, M. Barrone
    DOI: 10.1109/DDECS.2010.5654683
    KEYWORDS: memory test; system-on-chip; bist

  19. Enhanced Observability in Microprocessor-based Systems for Permanent and Transient Fault Resiliency
    L. Entrena, M. Gallardo-Campos, M. Garcia-Valderas, M. Grosso, C. Lopez-Ongil, M. Portela-Garcia, M. Sonza Reorda

  20. Evolving Individual Behavior in a Multi-Agent Traffic Simulator
    E. Sanchez, G. Squillero, A. Tonda
    Applications of Evolutionary Computation
    DOI: 10.1007/978-3-642-12239-2_2

  21. Exploiting Evolution for an Adaptive Drift-Robust Classifier in Chemical Sensing
    S. Di Carlo, M. Falasconi, E. Sanchez, A. Scionti, G. Squillero, A. Tonda
    Proceedings of EvoApplicatons 2010: EvoCOMPLEX, EvoGAMES, EvoIASP, EvoINTELLIGENCE, EvoNUM, and EvoSTOC
    DOI: 10.1007/978-3-642-12239-2_43
    KEYWORDS: real-valued function optimization; parameter optimization; realworld application; chemical sensors; artificial olfaction; bioinformatics
    ABSTRACT: Gas chemical sensors are strongly affected by drift, i.e., changes in sensors' response with time, that may turn statistical models commonly used for classification completely useless after a period of time. This paper presents a new classifier that embeds an adaptive stage able to reduce drift effects. The proposed system exploits a state-of-the-art evolutionary strategy to iteratively tweak the coefficients of a linear transformation able to transparently transform raw measures in order to mitigate the negative effects of the drift. The system operates continuously. The optimal correction strategy is learnt without a-priori models or other hypothesis on the behavior of physical-chemical sensors. Experimental results demonstrate the efficacy of the approach on a real problem

  22. Exploiting Wireless Sensor Networks for Monitoring Building Performance
    D. Apiletti, E. Baralis, T. Cerquitelli, S. Chiusano, B. Montrucchio, L. Murillo, M. Rebaudengo, E. Sanchez, D. Tonelli

  23. Fair Anti-Collision Protocol in Dense RFID Networks
    R. Ferrero, F. Gandino, B. Montrucchio, M. Rebaudengo
    KEYWORDS: reader-to-reader anti-collision; rfid

  24. Functional Test Generation for DMA Controllers
    M. Grosso, W. Perez H, D. Ravotto, E. Sanchez, M. Sonza Reorda, J. Velasco Medina
    11th IEEE Latin-American Test Workshop 2010

  25. Generating Power-Hungry Test Programs for Power-Aware Validation of Pipelined Processors
    A. Calimera, E. Macii, D. Ravotto, E. Sanchez, M. Sonza Reorda

  26. Hypervisor-Based Virtual Hardware for Fault Tolerance in COTS Processors Targeting Space Applications
    S. Campagna, M. Hussain, M. Violante
    DOI: 10.1109/DFT.2010.12

  27. On the mitigation of SET broadening effects in integrated circuits
    B. Sterpone L.
    DOI: 10.1109/DDECS.2010.5491820

  28. Towards Drift Correction in Chemical Sensors Using an Evolutionary Strategy
    S. Di Carlo, M. Falasconi, E. Sanchez, A. Scionti, G. Squillero, A. Tonda
    Proceedings of the ACM 12th Annual Conference on Genetic and Evolutionary Computation (GECCO)
    DOI: 10.1145/1830483.1830727
    KEYWORDS: algorithms applications; artificial olfaction; drift correction; evolutionary strategies; bioinformatics
    ABSTRACT: Gas chemical sensors are strongly affected by the so-called drift, i.e., changes in sensors' response caused by poisoning and aging that may significantly spoil the measures gathered. The paper presents a mechanism able to correct drift, that is: delivering a correct unbiased fingerprint to the end user. The proposed system exploits a state-of-the-art evolutionary strategy to iteratively tweak the coefficients of a linear transformation. The system operates continuously. The optimal correction strategy is learnt without a-priori models or other hypothesis on the behavior of physical-chemical sensors. Experimental results demonstrate the efficacy of the approach on a real problem