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Papers on Microprocessors

  1. Artificial evolution in computer aided design: from the optimization of parameters to the creation of assembly programs
    G. Squillero
    Computing, Special Issue on Bio-inspired Computing, Volume 93, Numbers 2-4, 103-120
  2. Automatic generation of software-based functional failing test for speed debug and on-silicon timing verification
    E. Sanchez, G. Squillero, A. Tonda
    MTV11: International Workshop on Microprocessor Test and Verification
  3. Post-Silicon Failing-Test Generation through Evolutionary Computation
    E. Sanchez, G. Squillero, A. Tonda
    19th IFIP/IEEE International Conference on Very Large Scale Integration (VLSI-SoC)
  4. Post-Silicon Functional Failing-Test Generation through Evolutionary Computation
    E. Sanchez, G. Squillero, A. Tonda
    ETS2005: IEEE European Test Symposium, 2005
  5. Microprocessor Software-Based Self-Testing.
    M. Psarakis, D. Gizopoulos, E. Sanchez, M. Sonza Reorda
    IEEE Design & Test of Computers, May/June 2010, pp. 4-18
  6. A Hybrid Approach to the Test of Cache Memory Controllers Embedded in SoCs
    W. J. Perez, J. Velasco-Medina, D. Ravotto, E. Sanchez, M. Sonza Reorda
    14th IEEE International On-Line Testing Symposium, 2008, pp. 143-148
  7. An Effective technique for the Automatic Generation of Diagnosis-oriented Programs for Processor Cores
    P. Bernardi, E. Sanchez, M. Schillaci, G. Squillero, M. Sonza Reorda
    IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 2008, Vo. 27, No. 3, pp. 570-574, March 2008
  8. Hardware and Software Transparency in the Protection of Programs Against SEUs and SETs
    E. L. Rhod, C. A. Lang Lisb?a, L. Carro, M. Sonza Reorda, M. Violante
    JETTA: The Journal of Electronic Testing: Theory and Applications, Springer Netherlands, Volume 24, Numbers 1-3, June 2008, pp. 45 - 56
  9. Combined software and hardware techniques for the design of reliable IP processors
    M. Rebaudengo, L. Sterpone, M. Violante, C. Bolchini, A. Miele, D. Sciuto
    DFT2006, 21th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 2006, pp. 265 - 273
  10. A New Hybrid Fault Detection Technique for Systems-on-a-Chip
    P. Bernardi, L. M. Veiras Bolzani, M. Rebaudengo, M. Sonza Reorda, F. L. Vargas, M. Violante
    IEEE Transactions on Computers, Vol. 55, No. 2, Feb. 2006, pp. 185-198
  11. A new approach to cope with single event upsets in processor-based systems
    M. Schillaci, M. Sonza Reorda, M. Violante
    LATW2006, 7th IEEE Latin-American Test Workshop, Buenos Aires, Argentina, March 26-29 2006, pp. 145-150
  12. A Fault Injection Environment for SoPC's Embedded Microprocessors
    M. Portela-Garcia, L. Sterpone, C. Lopez-Ongil, M. Sonza Reorda, M. Violante
    LATW2006, 7th IEEE Latin-American Test Workshop, Buenos Aires, Argentina, March 26-29 2006, pp. 68-73
  13. An Effective Technique for Minimizing the Cost of Processor Software-Based Diagnosis in SoCs
    P. Bernardi, E. Sanchez, M. Schillaci, G. Squillero, M. Sonza Reorda
    IEEE DATE2006: Design, Automation and Test in Europe, 2006, pp. 412-417
    BEST PAPER AWARD at IEEE DATE 2006
  14. Exploiting an I-IP for both Test and Silicon Debug of Microprocessor Cores
    P. Bernardi, M. Grosso, M. Rebaudengo, M. Sonza Reorda
    MTV'05: 6th International Workshop on Microprocessor Test and Verification, Austin (TX), USA, Nov. 3-4, 2005, pp. 55-60
  15. Diagnosing faulty functional units in processors by using automatically generated test sets
    P. Bernardi, E. Sanchez, M. Schillaci, M. Sonza Reorda, G. Squillero
    MTV'05: 6th International Workshop on Microprocessor Test and Verification, Austin (TX), USA, Nov. 3-4, 2005, pp. 37-41
  16. On the Transformation of Manufacturing Test Sets into On-Line Test Sets for Microprocessors
    E. Sanchez, M. Sonza Reorda, G. Squillero
    DFT'05: The 20th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, pp. 494-502
  17. Automatic Generation of Test Sets for SBST of Microprocessor IP Cores
    E. Sanchez, M. Sonza Reorda, G. Squillero, M. Violante
    SBCCI 2005, 18th IEEE Symposium on Integrated Circuits and Systems Design, pp. 74-79
  18. New Evolutionary Techniques for Test-Program Generation for Complex Microprocessor Cores
    E. Sanchez, M. Schillaci, M. Sonza Reorda, G. Squillero, L. Sterpone, M. Violante
    GECCO05: Genetic and Evolutionary Computation Conference, Washington, DC, USA, June 25-29 2005, pp. 2193-2194
  19. MicroGP - An Evolutionary Assembly Program Generator
    G. Squillero
    Genetic Programming and Evolvable Machines, vol. 6, no. 3, 2005, pp. 247-263
  20. Automatic Completion and Refinement of Verification Sets for Microprocessor Cores
    E. Sanchez, G. Squillero, M. Sonza Reorda
    Lecture Notes in Computer Science, Vol 3449, "Applications on Evolutionary Computing: EvoWorkkshops 2005", Lausanne (CH), March 2005, pp. 205-214
  21. Automatic Test Program Generation for Verifyng Microprocessors
    F. Corno, E. Sanchez, M. Sonza Reorda, G. Squillero
    IEEE Potentials, Vol 24, Issue 1, Feb-Mar 2005, pp. 34-37
  22. Automatic Verification of RT-Level Microprocessor Cores Using Behavioral Specifications: a Case Study
    L. Anghel, E. Sanchez, M. Sonza Reorda, G. Squillero, R. Velazco
    XIX Conference on Design of Circuits and Integrated Systems, Bordeaux, France, November 24-26, 2004
  23. Coupling Different Methodologies to Validate Obsolete Microprocessors
    L. Anghel, E. Sanchez, M. Sonza Reorda, G. Squillero, R. Velazco
    DFT'04: The 19th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems
  24. Automatic Test Programs Generation Driven by Internal Performance Counters
    W. Lindsay , E. Sanchez, M. Sonza Reorda, G. Squillero
    MTV'04: 5th International Workshop on Microprocessor Test and Verification, pp. 8-13
  25. Code Generation for Functional Validation of Pipelined Microprocessors
    F. Corno, E. Sanchez, M. Sonza Reorda, G. Squillero
    Journal of Electronic Testing: Theory and Applications, Vol 20(3), June 2004, pp. 269-278
  26. A Local Analysis of the Genotype-Fitness Mapping in Hardware Optimization Problems
    E. Sanchez, G. Squillero, M. Violante
    CEC2004, Congress on Evolutionary Computation, Portland (Oregon), June 20-23, 2004, pp. 871-878
  27. Automatic Test Program Generation - a Case Study
    F. Corno, E. Sanchez, M. Sonza Reorda, G. Squillero
    IEEE Design & Test, Special issue on Functional Verification and Testbench Generation, Volume: 21, Issue 2, March-April 2004, pp. 102-109
  28. Exploiting HW Acceleration for Classifying Complex Test Program Generation Problems
    E. Sanchez, G. Squillero, M. Violante
    of Evolutionary Computing: EvoWorkshops 2004 proceedings, Coimbra (Portugal), April 5-7 2004, pp. 230-239
  29. Code Generation for Functional Validation of Pipelined Microprocessors
    F. Corno, G. Squillero, M. Sonza Reorda
    ETW03: 8th IEEE European Test Workshop (Formal Proceedings), The Netherlands, May 25 28, 2003, pp. 113-118
  30. An Enhanced Framework for Microprocessor Test-Program Generation
    F. Corno, G. Squillero
    EUROGP2003: 6th European Conference on Genetic Programming, Essex (UK), April 14-16, 2003, pp. 307-315
  31. Exploiting Auto-Adaptive µGP for Highly Effective Test Programs Generation
    F. Corno, G. Squillero
    ICES2003: The 5th International Conference on Evolvable Systems: From Biology to Hardware, Trondheim (Norway), March 17-20, 2003, pp. 262-273
  32. Automatic Test Program Generation for Pipelined Processors
    F. Corno, M. Sonza Reorda, G. Squillero
    SAC2003: The Eighteenth Annual ACM Symposium on Applied Computing, Melbourne, Florida (USA), March 9-12, 2003, pp. 736-740
  33. Fully Automatic Test Program Generation for Microprocessor Cores
    F. Corno, G. Cumani, M. Sonza Reorda, G. Squillero
    DATE2003: Design, Automation and Test in Europe, Munich, Germany, March 3-7, 2003, pp. 1006-1011
  34. Evolutionary Test Program Induction for Microprocessor Design Verification
    F. Corno, G. Cumani, M. Sonza Reorda, G. Squillero
    ATS2002: IEEE Asian Test Symposium, Guam (USA), November 2002, pp. 368-373
  35. Efficient Machine-Code Test-Program Induction
    F. Corno, G. Cumani, M. Sonza Reorda, G. Squillero
    CEC2002: Congress on Evolutionary Computation, Honolulu, Hawaii (USA), pp. 1486-1491
  36. Automatic Test Program Generation from RT-level Microprocessor Descriptions
    F. Corno, G. Cumani, M. Sonza Reorda, G. Squillero
    ISQED2002: 3rd International Symposium on Quality Electronic Design, March 18-21, 2002, San Jose, California (USA), pp. 120-125
  37. Devising an RT-Level ATPG for uProcessor Cores
    F. Corno, G. Cumani, M. Sonza Reorda, G. Squillero
    WRTLT2001: 2nd Worshop on RTL, ATPG & DFT, Nara, Japan, November 22-23, 2001
  38. ARPIA: a High-Level Evolutionary Test Signal Generator
    F. Corno, G. Cumani, M. Sonza Reorda, G. Squillero
    EvoIASP2001: 3rd European Workshop on Evolutionary Computation applications to Image Analysis and Signal Processing, Como (Italy), April 20, 2001, pp. 298-306
  39. On the Test of Microprocessor IP Cores
    F. Corno, M. Sonza Reorda, G. Squillero, M. Violante
    DATE2001: IEEE Design, Automation & Test in Europe Conference, Munich (Germany), 13-16 March 2001, pp. 209-213
  40. A Genetic Algorithm-based System for Generating Test Programs for Microprocessor IP Cores
    F. Corno, M. Sonza Reorda, G. Squillero, M. Violante
    ICTAI2000: The Twelfth IEEE International Conference on Tools with Artificial Intelligence, Vancouver, British Columbia, Canada, November 13-15, 2000, pp. 195-198
  41. Faulty Behavior Observation on a Microprocessor System through a VHDL Simulation-Based Fault Injection Experiment
    A. Amendola, A. Benso, F. Corno, L. Impagliazzo, P. Prinetto, M. Rebaudengo, M. Sonza Reorda
    IEEE EURO-VHDL96, Geneva (Switzerland), September 1996