Papers on Programmable Bist

1. Embedded Memories Diagnosis: An Industrial Workflow
   D. Appello, P. Bernardi, M. Grosso, M. Rebaudengo, M. Sonza Reorda, V. Tancorre
   ITC06: IEEE International Test Conference, 2006, Santa Clara (CA), USA
2. Approaching production diagnostic for BIST-based testing
   D. Appello, P. Bernardi, D. Chindamo, M. Rebaudengo, M. Sonza Reorda, V. Tancorre
   SDD'04: 1st IEEE International Workshop on Silicon Debug and Diagnosis
3. On the diagnosis of embedded memory cores through Programmable BIST
   D. Appello, P. Bernardi, M. Rebaudengo, M. Sonza Reorda, V. Tancorre
   TRP'04: 5th IEEE International Workshop on Test Resource Partitioning