CAD

Papers on Simulation-Based Approaches

  1. Evolutionary Techniques Applied to Hardware Optimization Problems: Test and Verification of Advanced Processors
    E. Sanchez, G. Squillero
    [chapter in] Studies on Computational Intelligence, Vol 66, Advances in Evolutionary Computing for System Design, edited by Lakhmi C. Jain, Vasile Palade and Dipti Srinivasan, Springer publisher, 2007, ISBN 978-3-540-72376-9, pp. 83-106.
  2. Test Program Generation From High-level Microprocessor Descriptions
    E. Sanchez, M. Sonza Reorda, G. Squillero
    [chapter in] Test and validation of hardware/software systems starting from system-level descriptions, Edited by M. Sonza Reorda, M. Violante, Z. Peng, Springer publisher, 2005, 179 p, ISBN: 1-85233-899-7, pp. 83-106
  3. Automatic Test Program Generation for Verifyng Microprocessors
    F. Corno, E. Sanchez, M. Sonza Reorda, G. Squillero
    IEEE Potentials, Vol 24, Issue 1, Feb-Mar 2005, pp. 34-37
  4. Validation of the dependability of CAN-based networked systems
    F. Corno, J. Perez, M. Ramasso, M. Sonza Reorda, M. Violante
    IEEE High-level Design Validation and Test Workshop, pp. 161-164, 2004
  5. A multi-level approach to the dependability analysis of CAN networks for automotive applications
    F. Corno, J. Perez, M. Ramasso, M. Sonza Reorda, M. Violante
    International Conference Integrated Chassis Control(ICC), 10-12, Nov. 2004
  6. Evolutionary Simulation-Based Validation
    F. Corno, M. Sonza Reorda, G. Squillero
    International Journal on Artificial Intelligence Tools (IJAIT), Vol. 14, 1-2, Dec. 2004, pp. 897 916
  7. Code Generation for Functional Validation of Pipelined Microprocessors
    F. Corno, E. Sanchez, M. Sonza Reorda, G. Squillero
    Journal of Electronic Testing: Theory and Applications, Vol 20(3), June 2004, pp. 269-278
  8. Automatic Test Program Generation - a Case Study
    F. Corno, E. Sanchez, M. Sonza Reorda, G. Squillero
    IEEE Design & Test, Special issue on Functional Verification and Testbench Generation, Volume: 21, Issue 2, March-April 2004, pp. 102-109
  9. Automatic Generation of Validation Stimuli for Application-Specific Processors
    O. Goloubeva, M. Sonza Reorda, M. Violante
    DATE2004: Design, Automation and Test in Europe, 2004, pp. 188-193
  10. An Enhanced Framework for Microprocessor Test-Program Generation
    F. Corno, G. Squillero
    EUROGP2003: 6th European Conference on Genetic Programming, Essex (UK), April 14-16, 2003, pp. 307-315
  11. Exploiting Auto-Adaptive µGP for Highly Effective Test Programs Generation
    F. Corno, G. Squillero
    ICES2003: The 5th International Conference on Evolvable Systems: From Biology to Hardware, Trondheim (Norway), March 17-20, 2003, pp. 262-273
  12. Automatic Test Program Generation for Pipelined Processors
    F. Corno, M. Sonza Reorda, G. Squillero
    SAC2003: The Eighteenth Annual ACM Symposium on Applied Computing, Melbourne, Florida (USA), March 9-12, 2003, pp. 736-740
  13. Fully Automatic Test Program Generation for Microprocessor Cores
    F. Corno, G. Cumani, M. Sonza Reorda, G. Squillero
    DATE2003: Design, Automation and Test in Europe, Munich, Germany, March 3-7, 2003, pp. 1006-1011
  14. A New Evolutionary Paradigm for Cultivating Cellular Automata for Built-In Self Test of Sequential Circuits
    F. Corno, M. Sonza Reorda, G. Squillero
    [chapter in] Evolutionary Algorithms for Embedded System Design , edited by R. Drechsler and N. Drechsler, Kluwer Academic Publishers, October 2002, ISBN 1-4020-7276-7, pp.? 143-173
  15. Initializability Analysis of Synchronous Sequential Circuits
    F. Corno, P. Prinetto, M. Rebaudengo, M. Sonza Reorda, G. Squillero
    ACM Transactions on Design Automation of Electronic Systems, April 2002, pp. 249-264
  16. Evolutionary Test Program Induction for Microprocessor Design Verification
    F. Corno, G. Cumani, M. Sonza Reorda, G. Squillero
    ATS2002: IEEE Asian Test Symposium, Guam (USA), November 2002, pp. 368-373
  17. Evolutionary Techniques for Minimizing Test Signals Application Time
    F. Corno, M. Sonza Reorda, G. Squillero
    EvoIASP2002: 4rd European Workshop on Evolutionary Computation applications to Image Analysis and Signal Processing, Kinsale (Ireland), April 2002, pp. 183-189
  18. Automatic Test Program Generation from RT-level Microprocessor Descriptions
    F. Corno, G. Cumani, M. Sonza Reorda, G. Squillero
    ISQED2002: 3rd International Symposium on Quality Electronic Design, March 18-21, 2002, San Jose, California (USA), pp. 120-125
  19. An Evolutionary Algorithm for Reducing Integrated-Circuit Test Application Time
    F. Corno, M. Sonza Reorda, G. Squillero
    SAC2002: 17th ACM Symposium on Applied Computing, March 2002, Madrid (Spain), pp. 608-611
  20. Devising an RT-Level ATPG for uProcessor Cores
    F. Corno, G. Cumani, M. Sonza Reorda, G. Squillero
    WRTLT2001: 2nd Worshop on RTL, ATPG & DFT, Nara, Japan, November 22-23, 2001
  21. Effective Techniques for High-Level ATPG
    F. Corno, G. Cumani, M. Sonza Reorda, G. Squillero
    ATS2001: IEEE Asian Test Symposium, 2001, pp. 225-230
    Best Paper Award
  22. ARPIA: a High-Level Evolutionary Test Signal Generator
    F. Corno, G. Cumani, M. Sonza Reorda, G. Squillero
    EvoIASP2001: 3rd European Workshop on Evolutionary Computation applications to Image Analysis and Signal Processing, Como (Italy), April 20, 2001, pp. 298-306
  23. On the Test of Microprocessor IP Cores
    F. Corno, M. Sonza Reorda, G. Squillero, M. Violante
    DATE2001: IEEE Design, Automation & Test in Europe Conference, Munich (Germany), 13-16 March 2001, pp. 209-213
  24. Evolving Effective CA/CSTP BIST Architectures for Sequential Circuits
    F. Corno, M. Sonza Reorda, G. Squillero
    SAC2001: 16th ACM Symposium on Applied Computing, March 2001, Las Vegas (USA), pp. 345-350
  25. A Genetic Algorithm-based System for Generating Test Programs for Microprocessor IP Cores
    F. Corno, M. Sonza Reorda, G. Squillero, M. Violante
    ICTAI2000: The Twelfth IEEE International Conference on Tools with Artificial Intelligence, Vancouver, British Columbia, Canada, November 13-15, 2000, pp. 195-198
  26. Early power estimation for System-on-Chip designs
    M. Lajolo, L. Lavagno, M. Sonza Reorda, M. Violante
    PATMOS 2000: International Workshop - Power and Timing Modeling Optimization and Simulation, G? ttingen (Germany), September 2000, pp. 108-117
  27. Behavioral-level Test Vector Generation for System-on-Chip Designs
    M. Lajolo, L. Lavagno, M. Rebaudengo, M. Sonza Reorda, M. Violante
    IEEE International High Level Design Validation Workshop, The Claremont Resort & Spa, Berkeley, California, November 8-10 2000, pp. 21-26
  28. RT-Level ITC 99 Benchmarks and First ATPG Results
    F. Corno, M. Sonza Reorda, G. Squillero
    IEEE Design & Test of Computers, July-August 2000, pp. 44-53
  29. Exploiting the Selfish Gene Algorithm for Evolving Cellular Automata
    F. Corno, M. Sonza Reorda, G. Squillero
    IJCNN2000: IEEE-INNS-ENNS International Joint Conference Neural Networks, Como (I), July 2000, pp. 577-581
  30. Exploiting the Selfish Gene Algorithm for Evolving Hardware Cellular Automata
    F. Corno, M. Sonza Reorda, G. Squillero
    CEC2000: Congress on Evolutionary Computation, San Diego (USA), July 2000, pp. 1401-1406
  31. Automatic Test Bench Generation for Simulation-based Validation
    M. Lajolo, L. Lavagno, M. Rebaudengo, M. Sonza Reorda, M. Violante
    CODES2000: IEEE International Workshop on Hardware/Software Codesign, San Diego (USA), May 2000, pp. 136-140
  32. An Improved Cellular Automata-Based BIST Architecture for Sequential Circuits
    F. Corno, M. Sonza Reorda, G. Squillero
    ISCAS2000: IEEE International Symposium on Circuits and Systems, Geneve (CH), May 2000, pp. 76-79
  33. CA-CSTP: A new BIST Architecture for Sequential Circuits
    F. Corno, M. Sonza Reorda, G. Squillero, M. Violante
    ETW2000: European Test Workshop, May 2000, pp. 167-172
  34. System-level Test Bench Generation in a Co-design Framework
    M. Lajolo, L. Lavagno, M. Rebaudengo, M. Sonza Reorda, M. Violante
    ETW2000: European Test Workshop, May 2000, pp. 25-30
  35. Low Power BIST via Hybrid Cellular Automata
    F. Corno, M. Rebaudengo, M. Sonza Reorda, G. Squillero, M. Violante
    VTS2000: 18th IEEE VLSI Test Symposium, Montreal, Canada, May 2000, pp. 29-34
  36. High-Level Observability for Effective High-Level ATPG
    F. Corno, M. Sonza Reorda, G. Squillero
    VTS2000: 18th IEEE VLSI Test Symposium, Montreal, Canada, May 2000, pp. 411-416
  37. Evolving Cellular Automata for Self-Testing Hardware
    F. Corno, M. Sonza Reorda, G. Squillero
    ICES2000: Third International Conference on Evolvable Systems: From Biology to Hardware, Edinburgh (UK), April 2000, pp. 31-39
  38. Prediction of Power Requirements for High-Speed Circuits
    F. Corno, M. Rebaudengo, M. Sonza Reorda, G. Squillero, M. Violante
    EvoTel2000: European Workshops on Telecommunications, Edinburgh (UK), May 2000, pp. 247-254
  39. Automatic Validation of Protocol Interfaces Described in VHDL
    F. Corno, M. Sonza Reorda, G. Squillero
    EvoTel2000: European Workshops on Telecommunications, Edinburgh (UK), May 2000, pp. 205-213
  40. Automatic Test Bench Generation for Validation of RT-level Descriptions: an Industrial Experience
    F. Corno, A. Manzone, A. Pincetti, M. Sonza Reorda, G. Squillero
    DATE2000: Design, Automation and Test in Europe, Paris (F), March 2000, pp. 385-389
  41. High-level ATPG: a real topic or an academic amusement?
    M. Sonza Reorda
    IEEE International Test Conference, Atlantic City (USA), September 1999, Poster Session, pp. 1118
  42. High Quality Test Pattern Generation for RT-level VHDL Descriptions
    F. Corno, M. Sonza Reorda, G. Squillero
    MTV99: 2nd International Workshop on Microprocessor Test and Verification Common Challenges and Solutions, Atlantic City (USA), September 1999
  43. Simulation-Based Sequential Equivalence Checking of RTL VHDL
    F. Corno, M. Sonza Reorda, G. Squillero
    ICECS99: 6th IEEE International Conference on Electronics, Circuits and Systems, Paphos, Cyprus, September 1999, pp. 351-354
  44. Verifying the Equivalence of Sequential Circuits with Genetic Algorithms
    F. Corno, M. Sonza Reorda, G. Squillero
    CEC99: 1999 Congress on Evolutionary Computation, Washington DC (USA), July 1999, pp. 1293-1297
  45. Approximate Equivalence Verification for Protocol Interface Implementation via Genetic Algorithms
    F. Corno, M. Sonza Reorda, G. Squillero
    EuroEcTel99: R. Poli, H-M. Voigt, S. Cagnoni, D. Corne, G. Smith, T. Fogarty (eds.), Evolutionary Image Analysis, Signal Processing and Telecommunications First European Workshops, EvoIASP'99 and EuroEcTel'99 Goteborg, Sweden, May 1999 Joint Proceedings, Springer LNCS, 1999, pp. 182-192
    Special Jury Award for Outstanding Work Presented by a Student or Young Researcher
  46. RT-level TPG Exploiting High-Level Synthesis Information
    S. Chiusano, F. Corno, P. Prinetto
    17th IEEE VLSI Test Symposium, Dana Point (USA), April 1999
  47. Approximate Equivalence Verification of Sequential Circuits via Genetic Algorithms
    F. Corno, M. Sonza Reorda, G. Squillero
    DATE99: IEEE Design, Automation & Test in Europe, Munich (Germany), March 1999, pp. 754-755
  48. VEGA: A Verification Tool Based on Genetic Algorithms
    F. Corno, M. Sonza Reorda, G. Squillero
    ICCD98, International Conference on Circuit Design, Austin, Texas (USA), October 1998, pp. 321-326
  49. Experiences in the use of evolutionary techniques for testing digital circuits
    F. Corno, M. Sonza Reorda, M. Rebaudengo
    Applications and Science of Neural Networks, Fuzzy Systems, and Evolutionary Computation, SPIE 1998 Annual Meeting
    Invited paper
  50. On the Identification of Optimal Cellular Automata for Built-In Self-Test of Sequential Circuits
    F. Corno, N. Gaudenzi, P. Prinetto, M. Sonza Reorda
    VTS98: 16th IEEE VLSI Test Symposium, Monterey, CA (USA), April 1998
  51. Fast Sequential Circuit Test Generation Using High-Level and Gate-Level Techniques
    E. M. Rudnick, R. Vietti, A. Ellis, F. Corno, P. Prinetto, M. Sonza Reorda
    DATE98: Design, Automation and Test in Europe, Paris (F), February 1998
  52. A Genetic Algorithm for the Computation of Initialization Sequences for Synchronous Sequential Circuits
    F. Corno, P. Prinetto, M. Rebaudengo, M. Sonza Reorda, G. Squillero
    ATS97: The Sixth IEEE Asian Test Symposium, Akita (JP), November 1997, pp. 56-61
    Also included in the 10th Anniversary Compedium of Papers from Asian Test Symposium
  53. Testability analysis and ATPG on behavioral RT-level VHDL
    F. Corno, P. Prinetto, M. Sonza Reorda
    ITC97, IEEE International Test Conference, Washington D. C. (USA), November 1997
  54. A New Approach for Initialization Sequences Computation for Synchronous Sequential Circuits
    F. Corno, P. Prinetto, M. Rebaudengo, M. Sonza Reorda, G. Squillero
    ICCD97, October 1997, Austin, Texas (USA), pp. 381-386
  55. Cellular Automata for Sequential Test Pattern Generation
    S. Chiusano, F. Corno, P. Prinetto, M. Sonza Reorda
    VTS97: 15th IEEE VLSI Test Symposium, Monterey, CA (USA), April 1997, pp. 60-65
  56. New Static Compaction Techniques of Test Sequences for Sequential Circuits
    F. Corno, M. Rebaudengo, P. Prinetto, M. Sonza Reorda
    ED&TC97: IEEE European Design and Test Conference, Paris (F), March 1997, pp. 37-43
  57. SAARA: a Simulated Annealing Algorithm for Test Pattern Generation for Digital Circuits
    F. Corno, P. Prinetto, M. Rebaudengo, M. Sonza Reorda
    SAC97: 12th Annual ACM Symposium on Applied Computing, San Jose, CA (USA), February 1997, pp. 228-232
  58. Exploiting Competing Subpopulations for Automatic Generation of Test Sequences for Digital Circuits
    F. Corno, P. Prinetto, M. Rebaudengo, M. Sonza Reorda
    Fourth International Conference on Parallel Problem Solving from Nature, Berlin (Germany), September 1996
  59. Partial Scan Flip Flop Selection for Simulation-based Sequential ATPGs
    F. Corno, P. Prinetto, M. Rebaudengo, M. Sonza Reorda
    IEEE International Test Conference, Washington (USA), October 1996
  60. Comparing topological, symbolic and GA-based ATPGs: an experimental approach
    F. Corno, P. Prinetto, M. Rebaudengo, M. Sonza Reorda
    IEEE International Test Confernce, Washington (USA), October 1996
  61. A Genetic Algorithm for Automatic Generation of Test Logic for Digital Circuits
    F. Corno, P. Prinetto, M. Sonza Reorda
    IEEE International Conference On Tools with Artificial Intelligence, Toulouse (F), November 1996
  62. A Parallel Genetic Algorithm for Automatic Generation of Test Sequences for Digital Circuits
    F. Corno, P. Prinetto, M. Rebaudengo, M. Sonza Reorda
    International Conference on High-Performance Computing and Networking, Brussels (Belgium), April 1996
  63. Advanced Techniques for GA-based sequential ATPGs
    F. Corno, P. Prinetto, M. Rebaudengo, M. Sonza Reorda, R. Mosca
    IEEE Design & Test Conference, Paris (F), March 1996
  64. GATTO: a Genetic Algorithm for Automatic Test Pattern Generation for Large Synchronous Sequential Circuits
    F. Corno, P. Prinetto, M. Rebaudengo, M. Sonza Reorda
    IEEE Transactions on Computer-Aided Design, August 1996, Vol. 15, No. 8, pp. 943-951
  65. Uso di Tecniche Evolutive per la Risoluzione di problemi di CAD Elettronico
    F. Corno, P. Prinetto, M. Rebaudengo, M. Sonza Reorda
    Processori Dedicati, a cura di Lanfranco Lopriore, Fabrizio Luccio e Maria Marinaro, Collana CNR/Progetto Finalizzato "Sistemi Informatici e Calcolo Parallelo" diretta da Bruno Fadini, Franco Angeli Editore
  66. A Portable ATPG tool for Parallel and Distributed Systems
    F. Corno, P. Prinetto, M. Rebaudengo, M. Sonza Reorda, E. Veiluva
    IEEE VLSI Test Symposium, Princeton (USA), April 1995
  67. GARDA: a Diagnostic ATPG for Large Synchronous Sequential Circuits
    F. Corno, P. Prinetto, M. Rebaudengo, M. Sonza Reorda
    ED&TC95: IEEE European Design and Test Conference, Paris, March 1995
  68. A PVM tool for Automatic Test Generation on Parallel and Distributed Systems
    F. Corno, P. Prinetto, M. Rebaudengo, M. Sonza Reorda, E. Veiluva
    International Conference on High-Performance Computing and Networking, Milan (Italy), May 1995, Lecture Notes in Computer Science, Ed. Springer
  69. GATTO: an Intelligent Tool for Automatic Test Pattern Generation for Digital Circuits
    P. Prinetto, M. Rebaudengo, M. Sonza Reorda, E. Veiluva
    IEEE International Conference on Tools with Artificial Intelligence, New Orleans (USA), November 1994
  70. An Automatic Test Pattern Generator for Large Sequential Circuits based on Genetic Algorithms
    P. Prinetto, M. Rebaudengo, M. Sonza Reorda
    ITC94: IEEE International Test Conference, Washington D. C. (USA), October 1994
  71. Exploiting a Workstation Network for Automatic Generation of Test Patterns for Digital Circuits
    F. Corno, P. Prinetto, M. Rebaudengo, M. Sonza Reorda, A. R. Meo, E. Veiluva
    AICA94: Congresso Annuale Associazione Italiana per l'Informatica ed il Calcolo Automatico, Palermo (I), September 1994